Copyright 2007
Koji KIMOTO.
All rights reserved.
Research Topic Index
Last update: Wed, Mar 23, 2005
Methodology and Applications in Transmission Electron Microscopy (TEM)
and electron energy-loss spectroscopy (EELS).
Methodology
Software technique for high-resolution EELS.
  • Software technique (scripting) to realize 0.3 eV resolution using 300kV FEG with Gatan imaging filter(2002)
  • Deconvolution using maximum-entropy-algorithm and Richardson-Lucy algorithm for high-energy-resolution EELS (2003).

Spatial coherence of the inelastically-scattered electrons.

  • Lattice fringe contrast formed by inelastically-scattered electrons. (2001)
  • Experimental investigation of spatial coherence of low- and core-loss electrons (2003).
Coma-free alignment for high-resolution TEM.
  • Practical and simple procedure for coma-free alignment.(2003)
Element and chemical bonding analysis using EELS and ab initio calculation.
  • Cubic silicon nitride synthesized under high pressure.(2001)
  • High-Tc oxycarbonate superconductors using parallel EELS with gain-correction.(2001)
  • The coordination and the valence of Cr in High-Tc superconductors, YSrBaCrCuO. (2001)
Spatially-resolved EELS analysis using energy-filtering TEM.
  • Multilayer of dielectric materials for semiconductor devices (precise investigation of elemental and chemical bonding analysis).(1997) (1999)
Applications
Elemental mapping using energy-filtering transmission electron microscopy.
  • Dielectric thin films for semiconductor devices (light element analysis).(1996) (1997) (1998)
  • Multilayer for GMR head (high spatial resolution elemental mapping).(1994)
  • CoCr alloy films for magnetic recording media (Cr segregation on grain boundary).(1995) (1996)
  • Grain boundary of stainless steel with heat treatment (Cr depletion and M23C6 precipitates).
  • CVD diamond fine particles (sp2 & sp3 mapping)(2003).